The equipment of the CMA can be divided to fabrication and characterization devices. Fabrication devices installed in the clean room enable preparation of different kinds of micro- and nanostructures and materials research.

Characterization devices of the CMA can be widely utilized in materials research. Equipment include, several scanning electron microscopes (SEM),  a transmission electron microscope (TEM), an electron probe microanalyzer (EPMA), an x-ray diffractometer (XRD), and an x-ray fluorescence spectrometer (XRF). Instruments enable imaging, crystallographic studies, and elemental analysis of various samples.

The Centre has also equipment for sample preparation for all the analysis methods as well as software and databases for measurement data analysis.

In addition to the instruments of the CMA, the research units of the University have significant amount of fabrications and analysis instruments including scanning probe microscopes (SPM), FTIR- ja Raman-spectroscopy devices, ICP-MS, and ICP-OES. For the questions related to the use of these devices, contact the personnel of the research units.

Analysis Devices

X-Ray Devices

Fabrication Devices