Mueller Polarimetry Of Structured And Random Media: Cutting Edge Applications

Wednesday, November 18, 2015 to Friday, November 20, 2015


Infotech Oulu Doctoral Program


Lecturer: Dr Tatiana Novikova, Laboratory of Physics of Thin Films and Interfaces, Ecole polytechnique, Palaiseau, France

Date & time:

November 18, 2015 (Wednesday), 12-16
November 20, 2015 (Friday), 10-15

Room: TS267 (Tietotalo 1, OEM Lab)

The goal of this course is to introduce the basics of the optics of polarized light and to review the physical phenomena of interaction of polarized light with different complex media: layered, periodical, scattering, anisotropic and absorbing. It will be demonstrated that theoretical and experimental studies of polarized light interaction with a matter provide a lot of valuable information about the optical macroscopic and microscopic properties of the object, including diattenuation, birefringence, depolarization, scattering and absorption coefficients, surface morphology, etc. This information can be used in numerous applications starting from metrology of diffraction gratings to cancer detection and staging. The basic advantages of optical polarimetric techniques consist in being relatively low-cost, fast and non-destructive, thus allowing the measurements even for in-situ applications.

Having access to the complete set of experimental polarimetric data, namely, spectral and/or angular resolved Mueller matrices of the samples, proves to be the key issue for the accurate characterization of sample properties. The presented theoretical and experimental approach may be used for metrological applications in semiconductor industry and photovoltaics, for remote sensing in turbid media, for development of new polarimetric sensors for biomedical applications, etc.

Learning Objectives

This course will enable you to:

  • understand the theoretical background of polarization of the light, to learn about different formalisms used for the description of fully or partially polarized light;
  • be introduced to the basic polarimetric measurement techniques and basic polarimetric properties of any sample;
  • interpret the Mueller matrices of the sample via appropriate polar decomposition;
  • understand and explain the basics of polarized light diffraction on periodic diffraction gratings, and to discuss the potential applications of Mueller polarimetry for metrology in microelectronics and optics (critical dimension measurements, overlay defect, etc);
  • learn about Monte Carlo algorithm for the solution of vector radiative transfer equation in turbid media, when scattering of polarized light in absorbing media will be discussed;
  • be introduced to the cutting edge applications of multi-spectral Mueller matrix imaging sensors, including early detection of cancer and proper staging of the disease.

More information: Igor Meglinski

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Last updated: 3.11.2015